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Industry News / Manufacturing/Services / Test and Measurement

Agilent Adds High Impedance Mezzanine Functionality

January 28, 2009
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Agilent Technologies Inc. announced the expansion of its Acqiris high-speed digitizer product line with extended functionality on its PXI digitizers. Both the U1061A and U1062A, 8-bit and 10-bit digitizers, now feature an optional high impedance mezzanine, making these devices ideal for combination with a signal probe in ATE applications, such as telecommunications and semiconductor component testing.

The U1062A is a 10-bit, 4 GS/s, 3U PXI digitizer, with input bandwidths of up to 2 GHz and acquisition memories of up to 256 MS/ch. It significantly reduces testing and data-acquisition time, making the digitizer ideal for high-speed ATE applications, where test time should be limited only by the speed limits of the device under test (DUT). The dual-channel 8-bit U1061A, with up to 1 GHz of instantaneous bandwidth, provides synchronous sampling on both input channels of 1 GS/s with up to 8 MS of acquisition memory. In single-channel applications both digitizers provide the possibility of channel interleaving: Either channel can be selected and the ADC's interleaved, providing 2 GS/s and 16 MS memory (U1061A) and 4 GS/s and 512 MS (U1062A).

The new high-impedance front-end, which enables high-voltage measurements on both products, uses programmable front-end electronics to provide a complete set of input voltage ranges from 50 mV to 5 V full scale into 50 Ohms, and up to 50 V full scale into 1 MOhm impedance. With a bandwidth into 50 Ohms of 1 GHz for the U1061A and 1.4 GHz with the U1062A, using 1 MOhm impedance results in a bandwidth of 300 MHz. The amplifier response is optimized, with switchable filtering and very fast recovery from out-of-range signals.

The digitizers are fully compliant with both the PXI and CompactPCI standards, and are supported with AcqirisLive and AcqirisMAQS software and Windows®, Linux and VxWorks drivers for easy integration into production test and automatic test equipment (ATE).


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