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Industry News / Test and Measurement

Keithley's Component Test Solution Combines Ease of Use with Curve Tracer Capabilities

December 3, 2008
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Keithley Instruments Inc., a leader in emerging measurement solutions, announced ACS Basic Edition, characterization and curve tracer software for component test applications. The latest addition to Keithley's powerful Automated Characterization Suite (ACS) family, ACS Basic Edition integrates with the industry's broadest range of source-measure units, Keithley's SourceMeter® Instrument family. ACS Basic Edition, paired with Keithley's proven line of SourceMeter Instruments, replaces obsolete curve tracers with a solution that performs both basic curve tracing as well as parametric test while providing significant cost breakthrough. ACS Basic Edition is available immediately.

Keithley first introduced its ACS integrated test systems in 2007 as highly configurable, instrument-based systems for semiconductor characterization at the device, wafer, or cassette level, offering unique measurement capability with powerful and flexible automation-oriented software. Initial ACS systems were designed for larger semiconductor lab applications that call for a probe station and large-scale on-wafer test applications. ACS Basic Edition is targeted for bench-top component test applications that don't require integrated probers yet still need the measurement and software automation power provided by the ACS platform.


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