SUSS MicroTec Test Systems has won a head-to-head evaluation with its PA300PS with ProbeShield® Technology, the 300 mm wafer-level probe system for device characterization and reliability test. As a result, the major US integrated device manufacturer (IDM) has named SUSS as its exclusive supplier of on-wafer characterization systems for three years and is committed to work diligently in maintaining this position for many years beyond.

The decision follows a comprehensive evaluation where the ProbeShield Technology was thoroughly tested under laboratory conditions. These consisted mainly of advanced tests of semiconductor devices, such as flicker noise, I-V, C-V and S-parameter measurements, which are used to extract critical parameters in the device design and process control phases.

“The engineers at the manufacturer chose ProbeShield Technology due to positioning accuracy and significant time savings provided by advanced automation features such as ReAlign™ Technology for automatic alignment of probe tips to pads after a temperature change,” said Rick Dock, vice president of SUSS MicroTec Test Systems North America. “We are very excited about this particular win; it has validated the significance of both measurement accuracy and thermal automation when characterizing devices.”