advertisment Advertisement
This ad will close in  seconds. Skip now
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
Industry News

Measuring S-parameters: The First 50 Years

March 24, 2008
/ Print / Reprints /
| Share More
/ Text Size+
The past 50 years has witnessed a remarkable evolution in semiconductor technology. The devices that enable our wireless communication systems rely on sophisticated characterization. “Measuring the Q of a Parametric Diode” by Richard Harrison, the May 1960 Microwave Journal article reprinted in this month’s “Then & Now” Cover Feature...
To view the full article, please register or login.

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up

advertisment Advertisement