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Industry News / Semiconductors / Integrated Circuits

Rohde & Schwarz Joins LSTI

February 20, 2008
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Rohde & Schwarz has joined the LTE/SAE Trial Initiative (LSTI), through which leading telecommunications providers and network operators have banded together to promote the further development of broadband mobile radio networks that are based on UMTS Long Term Evolution (LTE) technology. By becoming a member, the company will contribute to the acceleration in interoperability testing (IOT) and the initial field tests. This, in turn, will shorten time-to-market for base stations and next generation wireless devices.


One objective of the LSTI is to ensure the interoperability of wireless networks and wireless devices from different manufacturers. Rohde & Schwarz will benefit the industry organization by providing its comprehensive expertise in test and measurement equipment for 2G, 3G and LTE technologies. The company will thus support the manufacturers and operators with suitable IOT test scenarios for LTE network simulation, for example. Moreover, it will share know-how gained through its active participation in the 3GPP standardization working groups.

Existing and future test and measurement solutions for LTE and MIMO will help users to ensure the reliability of LTE chipsets, wireless devices and base stations at an early stage of development. The comprehensive portfolio of Rohde & Schwarz products for mobile radio standards includes signal generators and signal analyzers, network simulators, protocol testers, coverage measurement systems, and test systems.

Roland Steffen, head of the test and measurement division at Rohde & Schwarz, commented, "Our inclusion in the LTE/SAE Trial Initiative represents a clear signal for us. From the very start, Rohde & Schwarz has fully embraced the further development of LTE technology. The mutual exchange of knowledge with other members benefits the entire initiative, and thus plays a significant part in promoting the next generation of mobile radio."

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