The 2007 IEEE MTT-S is highly valued by Cascade Microtech as a targeted venue for discussing our new RF characterization capabilities with our customers, for meetings with our partners and for its educational content based on the wide variety of technical papers and workshops.

We see many customers facing the challenges of continuing increases in device speed, higher levels of integration, new on-chip wireless functions and the usage of mixed-signal designs. All these drive the need for precision wafer-level RF measurements at ever higher frequencies.

More recently RF has become necessary for isolating, measuring, and modeling key parameters in advanced processes and advanced dielectrics. As a consequence we’re discovering many engineers, who once relied primarily on low-frequency measurements, are now adding RF to their test suites. This presents issues related to education, communication of best practices, and ease of system setup and validation.

We’ve been able to address these issues with our broad portfolio of products, experienced people and our strong world-wide presence.

The international composition of MTT-S attendees provides us an opportunity to showcase our RF wafer probes, probing systems and RF accuracy enhancement tools to customers from all our major markets worldwide.

At the 2007 MTT-S Cascade Microtech will share our recent innovations in VNA calibration techniques, device characterization and validation tools, and extensions to our line of RF probes.

Customers will also have the chance to meet with our factory technical experts and discuss issues related to wafer or package level RF characterization.

We look forward to the 2007 MTT-S and to many productive and enjoyable meetings with our customers and partners.