For engineers who are involved in test and measurement, the 69th ARFTG Conference being held at the Hilton Hawaiian Village, Honolulu, HI, on Friday, June 8, will offer a wealth of information via technical presentations, an interactive forum and an exhibition.

Besides presenting the latest results,the sessions also enable attendees to interact with their counterparts and experts in the automated RF and microwave test community.

The conference theme is "Addressing Metrology Needs for Future High-Speed Information and Communication Systems," with papers focussing on active-device characterization, on-wafer, multiport and differential measurement, accuracy of linear network analysis and complex waveform analysis.

The keynote speech on the emerging topic of "Characterization Challenges for Future Base-Station Power Amplifiers" will be held by Dr. Wolfgang Heinrich from FBH Berlin, Germany.

ARFTG is also co-sponsoring two workshops on Monday, June 4: "Advances in Active Device Characterization & Modeling for RF & Microwave" and "High Speed Digital Signal Integrity," as well as the NVNA Users' Forum on Thursday, June 7.