More
Modeling and Characterization of RF and Microwave Power FETs, by Peter Aaen, Jaime Plá and John Wood, is a book about the compact modeling of RF power FETs.
In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model.
A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling and in-package matching networks. These are illustrated using the current market-leading high power RF technology, LDMOS, as well as with III-V power devices. Stop by Cambridge University Press, booth 1869 at the MTT-S IMS show, and receive a 20 percent discount.
