- Buyers Guide
Military Microwaves Supplement
Anritsu Corp. and EMITE have announced that the Anritsu MT8820C One-Box Tester has been selected by EMITE as a supported test solution for MIMO OTA LTE compliance testing. The MT8820C is now fully integrated into the EMITE MIMO Graphic User Interface test software and has successfully being demonstrated to customers worldwide.
"We are pleased to work with EMITE to enable the wireless industry with the next generation of OTA test capability." said Kenji Tanaka, Executive Vice President of Anritsu. "The MT8820C is a unique RF-focused test solution with broad support for 2G, 3G and LTE testing. When coupled with EMITE test capability, our combined test solution will verify that new LTE devices will meet CTIA and other regulatory requirements."
"We are extremely happy to have Anritsu’s excellent base station emulators integrated in our solutions as this will certainly add value to our customers” said David Sanchez-Hernandez, CEO and co-founder of EMITE. ”Our unique multiple-cavity mode-stirred reverberation chamber solutions, when connected to the Anritsu MT8820C, allow for extremely fast LTE MIMO OTA testing, with the very first customer demos offering LTE TIS measurements in less than three minutes at one-third of the cost of other test solutions.”
The MT8820C LTE One-Box Tester is a multi-format 2G, 3G, and LTE tester with capability for UE calibration, RF parametric testing, and functional testing, including call processing or no-call based testing. Supported formats include LTE, W-CDMA/HSPA CDMA2K up to 1xEV-DO rel. A, TD-SCDMA/HSPA, and GSM/GPRS/EGPRS. EMITE’s mode-stirred reverberation chamber solutions (MSRC) provide for Rayleigh, Ricean, isotropic and non-isotropic fading environments. When combined, EMITE’s MSRC systems and Anritsu’s MT8820C now pave the way to make MIMO measurements simple for the extremely challenging demands of 3.9 and 4G systems.
Get access to premium content and e-newsletters by registering on the web site. You can also subscribe to Microwave Journal magazine.