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Industry News / Software & CAD / Test and Measurement

Pulsed I-V for Nonlinear Modeling

Current-voltage characterization under suitably performed pulsed bias conditions can more closely approximate the dynamic behavior of transistors and diodes under large signal RF conditions. Some understanding of the basics and a relatively simple inst...

March 1, 2003
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Accurate, nonlinear, active device models are critical to achieving design success for circuits such as power amplifiers, oscillators and mixers, using computer-aided engineering (CAE) software such as Agilent Technologies' Advanced Design System (ADS™), Applied Wave Research's Microwave Office™, Eagleware's Genesys™ or Ansoft's Serenade™. Prior work has made it clear...
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