advertisment Advertisement
This ad will close in  seconds. Skip now
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
Industry News

Test Equipment

December 1, 1999
/ Print / Reprints /
| Share More
/ Text Size+

Test Equipment

LabVIEW Integration Toolkit
The Summit series LabVIEW integration toolkit includes a comprehensive driver that allows semiconductor test engineers to perform rapid prototyping of an automated test system. The toolkit can leverage LabVIEW's graphical programming environment with effortless integration of measurement software with prober station control, complete automation of wafer test procedures and easy-to-use test development. An instrument driver, example programs, automated installation utility, on-line help and operating manual are included. The toolkit is compatible with Windows 95 and LabVIEW 5.x.
Cascade Microtech Inc.,
Beaverton, OR
(800) 550-3279 or (503) 601-1000.

Differential Device Test Systems
The ATN-4000 series test systems provide accurate and comprehensive characterization of differential devices. Single-ended and mixed-mode S parameters and time domain reflectometry data can be measured on devices used in RF, analog and data communication applications. Systems are available for measuring differential devices to 20 GHz and a turnkey system includes the company's hardware and software, a Hewlett-Packard vector analyzer network and a Pentium-based PC with general-purpose interface bus interface.
ATN Microwave Inc.,
North Billerica, MA
(978) 667-4200.

Portable IC Testers
The model 570 linear IC tester and the model 575 40-pin digital IC tester are hand-held, battery-powered IC test units for use by service technicians in the field or laboratory to identify or test any particular IC that is listed in the units' integrated test library. Both units provide pin-out information of the tested ICs. The model 570 features the automatic identification of unmarked/house-coded devices listing possible replacements, a conditional/unconditional loop testing mode, functional test emulation of passive circuitry to implement a comprehensive test in a variety of configurations and gain settings, and the ability to display diagnostic information including individual component pins. The model 575 features the ability to detect intermittent and temperature-related faults and display diagnostic information for individual pins. Prices: $995 (model 570) and $795 (model 575).
B&K Precision Corp.,
Placentia, CA
(714) 237-9220.

Spectrum Analyzer
The model LPT-2250 low cost, high performance spectrum analyzer provides stable and accurate frequency displays and sweeps over a bandwidth of more than 1 GHz. The LPT-2250 utilizes a fully synthesized RF system and has an integral cathode-ray tube display and powerful marker and video functions. A four-line liquid crystal display provides easy-to-read instrument settings and measurement values. Other options include a 2 GHz RF power meter, tracking generator, AM/FM receiver and Windows-compatible software. Price: less than $2700.
LP Technologies Inc.,
Wichita, KS
(316) 831-9696.

EMI Test Receiver
The ESI series new-generation electromagnetic interference (EMI) test receiver/analyzer is designed for full-compliance electromagnetic compatibility up to 40 GHz. Considered the fastest EMI test receiver available, the ESI can make peak, average and RMS detector measurements in 100 ms. The ESI family is a full certification EMI tester and operates in accordance with all relevant commercial and military standards. Price: starting from $69,500.
Tektronix Inc.,
Beaverton, OR
(800) 426-2200.

Post a comment to this article

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up

advertisment Advertisement