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Modeling of Metal and Substrate Losses in CMOS and BiCMOS Inductors for RFICs

An improved lumped-element equivalent circuit of silicon integrated inductors that accurately characterizes effects on the quality factor of the electromagnetic coupling between the metal strips and substrate

August 1, 1999
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Technical Feature

Modeling of Metal and Substrate Losses in CMOS and BiCMOS Inductors for RFICs

Paolo Arcioni, Rinaldo Castello, Luca Perregrini, Enrico Sacchi and Francesco Svelto

Please click here to view the pdf file of the Technical Feature

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