Accel-RF Instruments Corp., the worldwide leader in turn-key reliability and performance characterization test systems for compound semiconductors, has “unplugged” the industry-leading RF SMART Fixture from their automated test platform and made it available for bench-top testing. “Quantum-SMART” enables concurrent testing for reliability validation, performance-characterization, and product qualification through RF-biased burn-in and product functional testing.

“Unplugging the SMART Fixture from our accelerated life-test platform for use on a benchtop allows for a quantum reduction in the traditional semiconductor technology development roadmap” said Roland Shaw, President and CEO of Accel-RF. “Implementing Accel-RF’s Quantum SMART solution provides both accelerated and enhanced return on investment (ROI) by launching products into the market at a much faster pace. The streamlined productivity of this test solution is crucial for rapid insertion of the new generation of Gallium-Nitride (GaN) and Silicon-Carbide (SiC) compound semiconductor technologies envisioned in key commercial and military market sectors” concluded Shaw.

The Quantum SMART fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing independent pulsed-bias and pulsed-RF signals to a device-under-test (DUT) or remote subsystem. The signals are controlled from a user-interface compatible with Accel-RF”s LIFETEST software. The fixture is capable of “active” temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor.

For more information about Accel-RF’s Quantum SMART test fixture and other products for accelerating product launch visit