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Test and Measurement Channel / Industry News

Agilent's multi-channel test solution speeds up waveform creation and analysis

June 27, 2014
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Agilent Technologies Inc. announced the LTE/LTE-Advanced multi-channel PXI-based test solution, which accelerates the setup of multi-channel test system configurations and enables engineers to gain deeper insight into complex carrier aggregation and spatial multiplexing MIMO designs.

Designing and characterizing components and RF subsystems for base stations, microcells, picocells, repeaters and mobile devices is becoming more complex as multi-antenna designs require increasingly complex multi-channel test configurations. Agilent’s new test solution provides tools to generate complex LTE/LTE-A multi-channel/MIMO waveforms and analyze multiple channels in the frequency and modulation domains simultaneously. The easy-to-use graphical user interface shortens the time it takes to set up a test configuration. In addition, measurement setups are optimized for LTE/LTE-Advanced MIMO and carrier aggregation configurations.

The test solution’s chassis backplane trigger tool configures and routes the backplane triggers for proper time synchronization in MIMO configuration for up to two PXIe chassis. Time-synchronized MIMO testing (2x2 or 4x4) is easily accomplished using Agilent’s RF M9381A PXIe vector signal generators and M9391A PXIe vector signal analyzers, which provide less than 0.38% EVM and less than 20 nsec time synchronization between channels. In addition, the up to 160 MHz signal generation and analysis bandwidth is capable of supporting the widest LTE-Advanced carrier aggregation applications.

To learn more about the LTE-A multi-channel applications test solution, visit www.agilent.com/find/solution-LTE where you can download literature and register to attend the free webcast “Addressing Design and Test Challenges for the New LTE-Advanced Standard” on July 15. For product images go to www.agilent.com/find/LTE_images.

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