- Buyers Guide
Anritsu's family of RF VNAs for variety of passive device testing environments
Anritsu Co. addresses the market need for value and performance when testing RF passive devices with the introduction of the ShockLine™ MS46522A 2-port RF VNA family with frequency coverage from 50 kHz to 8.5 GHz. The ShockLine MS46522A VNA is designed for testing passive devices such as cables, connectors, filters, and antennas in a wide variety of engineering, manufacturing and education applications.
Two models are featured in the ShockLine MS46522A family. One VNA has frequency coverage from 50 kHz to 4.5 GHz, while the other extends the frequency range to 8.5 GHz. A 70 us/point sweep speed, as well as >110 dB dynamic range and corrected directivity of >42 dB make it ideal for simple and cost-sensitive engineering and educational applications. In addition, full S-parameter measurements on passive devices can be made with the ShockLine MS46522A VNA series. The instruments can also conduct path loss characterization of complex systems. Faults in broadband devices can be easily and quickly identified using a time domain with time gating option that is available for the VNAs.
Optimized for manual and automated applications, the ShockLine MS46522A series is compact and has remote programmability tools. A small 2U chassis allows the VNAs to easily slide into rack configurations. The ShockLine MS46522A supports SCPI command programming and has software driver support, so the VNAs can be easily integrated into most programming environments. The series also features a powerful graphical user interface for applications in which the ShockLine MS46522A is connected to a touchscreen monitor, keyboard and mouse. A LAN interface provides more robust control and faster data transmission compared to USB and GPIB, respectively.
Anritsu's ShockLine VNA family consists of the ShockLine MS46522A series, as well as the Economy ShockLine MS46322A 2-port VNA for measurements up to 40 GHz and the MS46524A 4-port VNAs for differential and multi-port device testing.