MicroApps at IMS 2014 (15 minute sessions and a keynote).
Click here for a complete listing of MicroApps at this year's IMS 2014.
|
Company |
Presenter |
Title |
|
Agilent |
Hock-Eng |
Microwave Power Amplifier Pulse Characterization using 8990B PPA |
|
Agilent |
Ryoji Takizawa, Shelley Begley |
Fast, Accurate and Nondestructive Solutions of Materials Test up to 1.1 THz and Recent New Features |
|
Agilent |
Rolland Zhang |
Effectively Maintain and Troubleshoot Mission Critical Communication Systems in the Field |
|
Agilent |
David Ballo |
Measurement Advances for Differential and I/Q Devices |
|
Agilent |
David Tanaka, Quek Theng-Theng |
Recent Improvements in Y-Factor Noise Figure Measurement Uncertainty |
|
Agilent |
Dingquig Lu |
Environment Scenario Simulation of Airborne, Space-Borne and Ship-Based Radar Systems |
|
Agilent |
Richard Overdorf |
New Technologies and Techniques for Wideband Analysis |
|
Agilent |
Richard Overdorf |
Phase Noise, Allan Variance, and Frequency Reference |
|
Agilent |
Greg Jue |
Flexible Digital Modulation Testing for Satellite Regenerative Payloads |
|
Agilent |
Dave Savage |
Using Digitizers to Characterize Modern Phased Array Antennas |
|
Agilent |
Troels S. Nielsen, Michael Dieudonné |
200W RF Power Amplifier Design using a Nonlinear Vector Network |
|
Agilent |
Jianjun Xu |
Dynamic FET Model – DynaFET - for GaN and GaAs Transistors from NVNA Active Source Injection Measurements |
|
Agilent |
Joan Gibson |
Implications of Emerging Technologies on Power Amplifier Manufacturing Test |
|
Agilent |
Bob Schaefer, Shelley Begley |
New Calibration Method Simplifies Measurements of Fixtured Devices |
|
Agilent EEsof |
Radek Biernacki |
Memory Effects Enhancements for X-Parameter Models in ADS |
|
Agilent EEsof |
Murthy Upmaka |
Flexible RF Stimulus and Response Validation of Emerging Comms Standards |
|
Agilent EEsof |
Andy Howard |
Advances in Load Pull Simulation |
|
Agilent EEsof |
Jack Sifri |
First-Pass Design Methodology for RF Modules |
|
Agilent Eesof |
Rulon Vandyke |
Pinpointing and fixing EVM, BER, and ACPR failures in RF Designs |
|
Agilent |
Dr. Mario Righi KEYNOTE |
How Digital Markets are Driving Microwave Technology |
|
Anteverty / Maury Microwave |
Mauro Marchetti |
Mixed-Signal Hybrid Load-Pull For High-Power Device Characterization |
|
Electro Rent |
Eric Oseassen |
Using a Vector Network Analyzer to characterize heterodyne NxM products |
|
EM Scan |
Dr. Arturo Mediano, Ruska Patton |
Near Field Scanner Demonstrations for RF/MW Engineers |
|
Maury Microwave |
Gary Simpson |
High-Speed Impedance Tuning |
|
Maury Microwave |
Gary Simpson |
New Noise Parameter Measurement, Extraction and Validation Techniques |
|
Maury Microwave |
Rusty Myers |
Interconnects Are Now Color-Coded |