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Agilent's MicroApps

May 30, 2014
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MicroApps at IMS 2014 (15 minute sessions and a keynote).    

 

Click here for a complete listing of MicroApps at this year's IMS 2014.

Company

Presenter

Title

Agilent

Hock-Eng

Microwave Power Amplifier Pulse Characterization using 8990B PPA

Agilent

Ryoji Takizawa, Shelley Begley

Fast, Accurate and Nondestructive Solutions of Materials Test up to 1.1 THz and Recent New Features

Agilent

Rolland Zhang

Effectively Maintain and Troubleshoot Mission Critical Communication Systems in the Field

Agilent

David Ballo

Measurement Advances for Differential and I/Q Devices

Agilent

David Tanaka, Quek Theng-Theng

Recent Improvements in Y-Factor Noise Figure Measurement Uncertainty

Agilent

Dingquig Lu

Environment Scenario Simulation of Airborne, Space-Borne and Ship-Based Radar Systems

Agilent

Richard Overdorf

New Technologies and Techniques for Wideband Analysis

Agilent

Richard Overdorf

Phase Noise, Allan Variance, and Frequency Reference

Agilent

Greg Jue

Flexible Digital Modulation Testing for Satellite Regenerative Payloads

Agilent

Dave Savage

Using Digitizers to Characterize Modern Phased Array Antennas

Agilent

Troels S. Nielsen, Michael Dieudonné

200W RF Power Amplifier Design using a Nonlinear Vector Network
Analyzer and Measured Load-dependent X-Parameters

Agilent

Jianjun Xu

Dynamic FET Model – DynaFET - for GaN and GaAs Transistors from NVNA Active Source Injection Measurements

Agilent

Joan Gibson

Implications of Emerging Technologies on Power Amplifier Manufacturing Test

Agilent

Bob Schaefer, Shelley Begley

New Calibration Method Simplifies Measurements of Fixtured Devices

Agilent EEsof

Radek Biernacki

Memory Effects Enhancements for X-Parameter Models in ADS

Agilent EEsof

Murthy Upmaka

Flexible RF Stimulus and Response Validation of Emerging Comms Standards

Agilent EEsof

Andy Howard

Advances in Load Pull Simulation

Agilent EEsof

Jack Sifri

First-Pass Design Methodology for RF Modules

Agilent Eesof

Rulon Vandyke

Pinpointing and fixing EVM, BER, and ACPR failures in RF Designs

Agilent

Dr. Mario Righi

KEYNOTE

How Digital Markets are Driving Microwave Technology

 

 

Anteverty / Maury Microwave
Agilent Ave

Mauro Marchetti

Mixed-Signal Hybrid Load-Pull For High-Power Device Characterization

Electro Rent
Agilent Ave

  Eric Oseassen

Using a Vector Network Analyzer to characterize heterodyne NxM products

EM Scan
Agilent Ave

Dr. Arturo Mediano, Ruska Patton

Near Field Scanner Demonstrations for RF/MW Engineers

Maury Microwave
Agilent Ave

Gary Simpson

High-Speed Impedance Tuning

Maury Microwave
Agilent Ave

Gary Simpson

New Noise Parameter Measurement, Extraction and Validation Techniques

Maury Microwave
Agilent Ave

Rusty Myers

Interconnects Are Now Color-Coded

Recent Articles by Agilent Technologies

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