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Microwave Measurements for Emerging Technologies

May 8, 2014
KEYWORDS ARFTG / measurement
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Mohamed Sayed

Welcome to the 83rd Automatic RF Techniques Group (ARFTG) Microwave Measurement Conference being held at the Tampa Marriott Waterside Hotel and Marina on Friday, June 6, 2014.

The Friday conference schedule includes two invited talks covering important emerging technology measurement issues. Nuno Borges Carvalho (University of Aveiro) will present a talk entitled “Instrumentation in Mixed-Signal and Mixed-Domain Emerging Technologies” opening up the mixed-signal/nonlinear portion of the content. Katia Grenier (LAAS-CNRS) will present “Microwave Measurements for Biological Materials Analysis” starting the portion of the conference content dealing with measurements and calibration in complex media. The program contains 14 additional talks and 18 interactive forum papers in areas of current measurement interest. The interactive forum is co-located with the vendor exhibits over extended breaks allowing much more interaction than is possible in larger halls.

The contributed conference papers range from practical methods and techniques to cutting edge research on measurement technology and over such topics as nonlinear measurement systems, calibration issues, on-wafer measurement, mixed-signal topics, broadband and millimeter-wave, and other areas of RF and microwave measurement. This year, ARFTG is co-located with the WAMICON Conference (as part of the same registration for even more technical content).

Your ARFTG conference registration also includes access to joint IMS/ARFTG measurement sessions on Thursday, the Nonlinear Vector Network Analyzer (NVNA) Users’ Forum on Thursday, and a one year membership in ARFTG. Thursday’s joint sessions are “Novel Measurement Methods for Microwave Active Devices” and “Millimeter-wave and Monolithic Measurement Techniques.” The NVNA Users’ Forum is an informal discussion group devoted to sharing information and issues related to instrumentation utilized in vector large-signal analysis of microwave circuits and systems. This event is open to all ARFTG, IMS and RFIC attendees.

Consider also registering for one of the ARFTG sponsored workshops: “Efficient RF Design using Practical Behavioral Models – Bridging the Gap between Measurement and Simulation” and “Challenges and Advances in Wafer-Level Calibration and Characterization at Millimeter and Sub-Millimeter-Wave Frequencies.” These all-day workshops are scheduled for the Monday of Microwave Week and provide focused analysis of these interesting topics.

No better opportunity is available to interact with vendors, experts and colleagues in the RF and microwave test and measurement community. Ask questions, propose collaboration or simply learn from the experiences being discussed. ARFTG’s two annual conferences are well-known for this unique opportunity and welcoming environment. Starting with breakfast and continuing through the exhibition, interactive forum and luncheon, there will be ample opportunity for discussion with others facing similar challenges. Attendees find that these interactions are often the best source of ideas and information for their current and future projects.

Full details of the technical program and of the conference are available at www.arftg.org. ARFTG conference registration is available through the IMS website at www.ims2014.org.

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