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ThinkRF announced that five of its employees – Nikhil Adnani, PhD; Tim Hember; Tarek Helaly, PhD; Mohammad Farhan and Ian Ward – have been recognized for their participation in this year’s IEEE AUTOTESTCON. AUTOTESTCON is the world’s premier conference that brings together the military/aerospace automatic test industry and government/military acquirers and users to share new technologies, discuss innovative applications, and exhibit products and services.
The paper, titled Wideband 20 GHz RF Digitizer and Python-based Open Application Framework for Test and Measurement, received the Walter E. Peterson award for Best Paper on Technology. This was an exciting win for the Ottawa-based company.
The IEEE AUTOTESTCON Walter E. Peterson Award is presented each year to the best paper on technical topics at the Conference. It is awarded in honor of Mr. Peterson and perpetuates his technical leadership, interest and inspiration in the introduction and utilization of new and advanced technology in the design and manufacture of automated test systems.
"Our WSA5000 is being recognized by the market as the wireless spectrum analysis platform for applications from RF optimization, to in-place monitoring, to automated test equipment" says ThinkRF CEO, Nikhil Adnani. "We're very grateful for the IEEE's substantiation of our efforts."
The theme for this year’s AUTOTESTCON was ATS Innovation in the Era of Challenging Budgets. Test and measurement budgets have been shrinking, making many high-performance spectrum analyzers unaffordable and impractical. Developing a cost-effective, high-performance solution for signal analysis is the challenge the team at ThinkRF has worked to solve.
ThinkRF recently launched its third generation signal analysis solution – the WSA5000 – a high-performance, software defined RF receiver/digitizer. ThinkRF provides a complete and comprehensive line of high-performance RF receiver front ends, tuner/down-converters and receiver/digitizer/analyzers. These products are used by a number of Fortune 1000 companies for applications such as test and measurement, spectrum monitoring and signals intelligence.
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