Welcome to Microwave Journal's Online Show Daily coverage of NIWeek 2013 in Austin, TX, August 5-8. Our coverage includes exclusive content from NIWeek organizers, exhibitors, the latest company announcements, multimedia, keynote talks, social media and commentary from our on-site editorial staff.
A Note from the Editor
National Instruments may be best known through the RF/microwave world’s test labs for LabVIEW, its flagship software product that provides a platform for developing automated data acquisition systems and the modular instruments that perform actual RF tests. Recently, through internal R&D and acquisitions, the company has been growing its RF solutions to provide more capabilities and performance in test hardware operating at RF frequencies and above. With the acquisition AWR and the RF EDA platform, Microwave Office, NI has also pushed its solution further upstream in the overall design process.
Special NIWeek 2013 RF/Wireless Panel
Date: August 6, 2013
Time: 4:45 p.m. CDT
Sponsored by: National Instruments
Presented by: Microwave Journal, live from NIWeek
Microwave Journal, in partnership with National Instruments, invites you to join a live panel discussion at NIWeek. The topic: Is your RF test bench obsolete? Complete with streaming video and audio, you can participate in the discussion and submit questions for the panel, all from the convenience of your desk.
To view the recorded session, please click here.
NIWeek 2013 RF & Wireless Summit Highlights
Hear from RF, microwave, and wireless industry experts as they explain the latest trends, emerging technologies, and test techniques at the RF and Wireless Test Summit. Technologies discussed will include Software-designed Instrument, FPGA signal processing, MIMO, advanced network analysis, microwave system simulation, and microwave frequency synthesis. Some highlights are listed below:
Keynote: The Massively Broadband® Wireless Future
Dr. Theodore (Ted) Rappaport, Professor, Polytechnic Institute of New York University
Design, Co-Simulation, and Testing Framework for Amplifiers With Digital Predistortion
Takao Inoue, Senior RF Platform Engineer, National Instruments
Future of Wireless, mmWave, and Beyond
Dr. Paul Khanna, Vice President, Phase Matrix Inc. and Mark Cudak, Principal Research Specialist, Nokia Siemens Network
Challenges in Testing Future Wireless Infrastructure
Tim Hentschel, Managing Director, Signalion
NIWeek keynote presentations deliver the latest advancements in design, research, and test from leading technology thought leaders. Join NI on August 6–8 to learn how you can accelerate productivity, innovation, and discovery with National Instruments via their livestream of the keynote sessions.
NIWeek is a global conference on graphical system design that brings together more than 3,200 leading engineers and scientists across a spectrum of industries, from automotive to telecommunications to robotics to energy. NIWeek provides technical networking and instruction with interactive sessions by NI R&D engineers and guest lecturers; targeted industry summits; hands-on workshops; exhibitions on the latest advancements in design, research, and test; and keynote presentations from leading technology thought leaders.
NIWeek provides an excellent learning environment for engineers to develop applications faster, smarter, and more cost-efficiently. The event includes over 250 interactive technical sessions, case study presentations, and panel discussions for beginners and advanced developers. These sessions help you learn how to optimize efficiency in your test and DAQ systems; implement advanced technology for industrial design, measurement, and control; and discover emerging trends in science and industry. Earn continuing education units (CEUs) and take software certification exams for NI LabVIEW, NI LabWindows™/CVI, and NI TestStand software.
More on NIWeek:
NI Featured Articles in Microwave Journal
Envelope Tracking Fundamentals and Test Solutions
June 14, 2013
Mesuro launches Rapid Load Pull test solution
May 31, 2013
AWR announces agenda of activities for IMS 2013
May 21, 2013