- Buyers Guide
300 MB/s Downlink Carrier Aggregation Test Capability now Available with Flexible Platform Configurations
Anritsu Company announces the availability of LTE Advanced Carrier Aggregation (CA) Measurement Software for its MT8820C RF Tester, enabling analysis of leading-edge mobile devices incorporating the new ultra-fast technology evolution. The new option leverages the ParallelPhone Mode (PPMTM) dual-RF capability of the MT8820C to simulate inter-band and intra-band downlink frequency domain duplex (FDD) CA with call processing.
With the software installed, the MT8820C becomes the first single-box tester with the capability to conduct three critical CA receiver measurements, providing LTE device designers and manufacturers with a cost- and space-efficient solution.
“Anritsu is pleased to support LTE Advanced CA with our flexible MT8820C RF Tester. We understand that consumers continue to demand ever-faster data rates, and are pleased to support the wireless device supply chain with new test capability to meet these demands,” said Michael Barrick, Senior Business Development Manager, Anritsu Company. “We look forward to supporting the industry with additional LTE Advanced capabilities as carriers continue to deploy new features.”
The MT8820C RF Testeris a multi-format 2G, 3G, and 4G/LTE tester with capability for wireless device calibration, RF parametric testing, and functional testing, including call processing or no-call based testing. The MT8820C currently supports LTE (FDD and TDD), W-CDMA/HSPA to DC-HSDPA, CDMA2K to single and multi-carrier 1xEV-DO rel. A, GSM/(E)-GPRS, and TD-SCDMA/HSPA. Through Anritsu’s unique PPM technology, combinations of these technologies may also be supported, including SV-LTE, SVDO, CSFB, and redirection. PPM also enables other technologies that require two simultaneous RFs, including DC-HSDPA, LTE 2x2 MIMO, and now FDD downlink CA, to be tested more effectively.
Get access to premium content and e-newsletters by registering on the web site. You can also subscribe to Microwave Journal magazine.