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Keithley Instruments Inc., a world leader in advanced electrical test instruments and systems, announces enhancements to its Automated Characterization Suite (ACS) software that support its expanding family of high power semiconductor characterization solutions. The ACS package is optimized for automated wafer-level parameter test applications, including automated characterization, reliability analysis, and known good die testing. The ACS V5.0 update specifically leverages the high power capabilities of Keithley’s Model 2651A (high current) and Model 2657A (high voltage) System SourceMeter® SMU instruments to enable automated wafer-level testing of high power semiconductor devices like power MOSFETs, IGBTs, BJTs, diodes, etc. To learn more, visit http://www.keithley.com/products/semiconductor/characterizationsoftware.
Keithley has incorporated a variety of enhancements into ACS V5.0:
ACS combines multiple instruments into a unified test environment optimized for flexibility, speed, and productivity in testing and analysis. Its intuitive GUI simplifies configuring test instrumentation, setting measurement parameters, making I‑V measurements, and displaying results. Users can go from creating a new test setup to characterizing new devices in a fraction of the time required by older test development approaches. Just as important, ACS provides all the tools needed to set up tests, analyze data, and export results—without ever leaving the ACS environment. ACS is designed for testing with semi and fully automatic probers; Keithley also offers ACS Basic Edition software for performing semiconductor device characterization with manual probers or test fixtures.
ACS V5.0 is available with a number of Keithley characterization instrument and system configurations. Users of earlier versions should contact their representative for assistance regarding ACS upgrades.
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