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Home
» Using Test Equipment to Extract Behavioral RF Device Models for Communications System Design
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Using Test Equipment to Extract Behavioral RF Device Models for Communications System Design
David A. Hall, National Instruments, Austin, TX; Janne Roos, AWR – APLAC Division, Espoo, Finland
March 14, 2013
David A. Hall, National Instruments, Austin, TX; Janne Roos, AWR – APLAC Division, Espoo, Finland
1 Comment
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