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In Print

May 2013 Digital Edition Online Edition

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From a Russian Source

Oscillator and synthesizer developments in Russia

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The Premier of EDI CON

A look at an emerging community and its unique technology needs in a recap of EDI CON 2013

Featured

Efficiency Enhanced Amplifier Using a Digitally-Controlled Dynamic Bias Switching Circuit

The MWJ Buyer's Guide

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Click this featured vendor's logo for the latest RF/microwave products, catalogs, brochures and company news.
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California receives first-ever white space broadband network

Cobham purchases Axell Wireless Ltd.

MTT-S IMS 2013 Online Show Daily

Disposable wireless heathcare sensor market shows signs of life

Richardson RFPD Announces IMS 2013 Schedule

Better than photos - Northrop Grumman, U.S. Navy conduct arrested landing of X-47B unmanned demonstrator

- Northrop Grumman, U.S. Navy conduct arrested landing of X-47B unmanned demonstrator

TPR1000 - SiC High Power Transistors for Next Generation VHF/UHF Radar

- Wireless Trends to Look for at MWC 2013

LTE and WSN - Wireless Sensor Networks: Overcoming the Challenges to Reach $2 B in 2021

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Home » Synthetic Instrumentation: The Future of Test
Test and Measurement Channel

Synthetic Instrumentation: The Future of Test

Mike Santori, National Instruments; Jean Dassonville and Phil Lorch, Agilent Technologies; and Dave Hutton, Aeroflex
March 14, 2013
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SMART^Eä True Synthetic Test Environment

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Experts from National Instruments, Agilent Technologies and Aeroflex weigh in on the future of RF/microwave test and measurement instrumentation.
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