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Test and Measurement Channel / Industry News

Agilent to demo new solutions enabling tests from prototype validation to inline high-volume manufacturing at IPC APEX

February 1, 2013
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Agilent Technologies Inc. will demonstrate its latest boundary scan analyzer, plus inline in-circuit and functional test systems at the IPC APEX EXPO, Feb. 19-21, at the San Diego Convention Center (Booth 2827) in San Diego, Calif.

These latest innovations provide greater flexibility, allowing users to re-use tests and hardware investments all the way from design validation and prototyping, right through pre-ramp-up and mass manufacturing phases.

Agilent experts will demonstrate:

  • A versatile new boundary scan analyzer, which offers quick test turn-around and extensive coverage, from design and validation to new product introduction and mass manufacturing.
  • The low-cost Medalist i1000D ICT, which has the smallest footprint in the market. This system comes complete with an integrated board handler for automating manufacturing tests of smartphones, LEDs, automotive fuse boxes, and more. The i1000D includes digital testing, boundary scan and serial programming capabilities.
  • The  fully integrated inline Medalist i3070 Series 5 in-circuit test system with short-wire fixturing, known for its ease of test transportability and repeatability. This award-winning suite includes limited-access tests, LED tests, and an easy-to-use interface.
  • The Agilent i1000D diagnostics test set, a custom, modular ICT-featured instrument. For use in R&D, repair and functional test, it provides faster prototype turn-on and precise repair diagnostics.

Solution partners will also be present in the Agilent booth, demonstrating cost-effective, state-of-the-art software for analysis, simulation and implementation of the most demanding circuit-board production tests.

Additional information is available at www.agilent.com/find/ict

Recent Articles by Agilent Technologies Inc., Santa Clara, CA

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