Auriga Microwave to participate in EDI CON 2013 as exhibitor and invited speaker
Auriga Microwave, a leading innovator in the design of high-powered RF and microwave devices announced that the company will be participating as an exhibitor at EDI CON 2013 in Beijing, China, showcasing the company’s expertise in solid-state device measurement, characterization, and modeling, which is critical to understanding of the device physics behind state-of-the-art GaN- and GaAs-based technologies. In addition, the company’s Chief Technical Officer, Yusuke Tajima has been invited by the conference organizers to present a talk on high-frequency nonlinear device characterization techniques.
Auriga integrates digital, analog, and microwave circuitry to design amplifiers and RF front-end solutions that maintain compact size and affordability. Utilizing a combination of original and established design techniques including Envelope-Tracking, N-way Doherty, switch-mode biasing (Class D, E, and F), and digital/analog pre-distortion, the company is at the forefront of RF, microwave design innovation. To support these advanced designs, Auriga has developed in-house modeling capability replacing standard foundry models allowing the company’s MMIC design team to achieve first-pass success and optimize performance. Dr. Tajima will specifically talk on the subject of nonlinear device characterization and measurement systems that provide the transistor models at the heart of RF and microwave design.
Prior to being the company’s CTO, Dr. Tajima has been the Director of Modeling and Design for Auriga Measurement Systems working on the pulsed IV measurement system, new circuit designs and device models has been published in many papers and patents. Yusuke Tajima received B.S. and PhD degrees from Tokyo University in Electronics Engineering in 1970 and 1980, respectively. He continued his research and development work at Toshiba Central Lab in Japan and then at Raytheon Research Division in Massachusetts, which he joined in 1979.
“Accurate device models are critical to the successful design of RF and microwave electronic components, which in turn are the building blocks of all high-frequency based systems. With EDI CON’s technical program focused on furthering the understanding of high-frequency design from the component through system-level, it is important that engineers also understand how the models used in simulation work and are derived through measurement.”, said David Vye EDI CON technical advisory committee organizer. “Dr. Tajima has contributed many innovations in microwave devices and characterization methods, which will be of great interest to EDI CON’s target audience of design engineers in China.”