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Test and Measurement Channel / Industry News

Lake Shore Cryotronics to showcase photonic material characterization at SPIE Optics and Photonics 2012

August 6, 2012
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Lake Shore Cryotronics Inc., a manufacturer of scientific sensors, instruments, and systems for precise measurement and control, announces that it will feature its new cryogen-free cryogenic probe stations and the 8400 Series Hall effect measurement system at SPIE Optics and Photonics, August 12-16, at the San Diego Convention Center in San Diego, CA, in Booth #1122.

Dr. Jeffrey R. Lindemuth, Lake Shore’s senior scientist, will present a paper, “Variable Temperature Hall Measurements on Low-Mobility, High-Resistivity Materials”. This paper will be part of Session 4: Novel PV Materials and Characterization Methods, on Sunday August 12, from 3:30 to 5:10 p.m. The results presented in this paper were achieved using Lake Shore’s 8400 Series Hall effect measurement system and reflect breakthrough characterization capabilities that are important to developers of novel photovoltaic materials.The Model 8404 has an optional AC field measurement capability that enables measurement of Hall mobilities down to 0.001 cm2/Vs, lower than ever possible using traditional DC field Hall measurement techniques. The system comes with optional variable temperature assemblies for temperatures from 15 K to 1273 K.

Lake Shore will also be at the exhibition center, with product experts on hand to discuss the new Model 8400 AC Hall Effect measurement systems as well as the advantages ofthe company’s new cryogen-free probe stations, including the new low cost CRX-6.5 K probe station.These easy-to-operate cryogenic platforms enable convenient and versatile testing of optical devices, providing superior results and productivity when compared to traditional methods requiring manual immersion of test devices in liquid nitrogen. 

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