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Agilent collaborates with Thales to apply X-parameters* to RF system design

June 21, 2012
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Agilent Technologies Inc. announced that its ongoing collaboration with Thales, a global technology leader for the defense and security and the aerospace and transport markets, has expanded the reach of X-parameters technology to wideband super-heterodyne receiver applications

X-parameters represent an entirely new category of nonlinear network parameters for high-frequency design. They allow engineers to accurately characterize linear and nonlinear components, circuits or systems, and provide fast and reliable behavioral modeling—capabilities vital to designing high-performance RF modules and system-in-package components. X-parameters can be generated either from simulation with Agilent’s Advanced Design System EDA software or from Agilent’s test and measurement instruments, for faster development of communications products.

Agilent’s collaboration with Thales on nonlinear behavioral models began in 2005. The primary goal of the effort was for Thales to validate the use of the technology for RF system design. As a result of this collaboration, Thales successfully developed a high-accuracy spurious analysis methodology based on X-parameter models.

The Thales technique supports arbitrary topology and has been tested for RF systems with single-frequency conversion. Subsequent spurious analysis of such systems has yielded excellent results. Additionally, the accuracy and dynamic range of the spectral content far surpassed results obtained using other currently available industry methods and models.

“We are proud to have worked with Agilent over the years as the X-parameters concept has grown in acceptance within the industry,” said Jean Paul Martinaud, hardware modeling manager with Thales Defence Mission Systems Division. “We have been able to extend the application of X-parameters to single-frequency conversion modeling, something that traditionally would have been done using conventional nonlinear behavioral models. We look forward to continuing this collaborative effort and working toward further extending the use of X-parameters to more complex systems.”

“As the inventors of X-parameters, Agilent continues to innovate around the technology in response to the challenges of nonlinear modeling and measurement,” said Thierry Locquette, a sales manager for Agilent EEsof EDA. “Our work with Thales has resulted in yet another proof-of-concept of this technology and further cements its position as the de facto industry standard.”

Agilent will demonstrate X-parameters, along with solutions that cover everything from circuit-level modeling through system verification for general RF, microwave, 4G communications, and aerospace/defense applications, at IMS 2012/IEEE MTT-S (Booth 1015), June 19-21, in Montréal, Canada. A range of premier partner solutions will also be available on Agilent Avenue and throughout the event area.

For more information on X-parameters, go to www.agilent.com/find/eesof-x-parameters.

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