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Welcome to the 79th Automatic RF Techniques Group (ARFTG) Microwave Measurement Conference being held at the Palais des Congrès de Montréal, on Friday, June 22, 2012. The conference will include technical presentations, an interactive forum and an exhibition; all to give you ample opportunity to interact with your colleagues in the RF and microwave test and measurement community.
The conference theme is “Nonlinear Measurement Systems” and we are looking forward to the invited talks of Dr. Jacques Sombrin on “Future Test Benches for the Optimization of Spectrum and Energy Efficiency in Telecom Nonlinear RF Components and Amplifiers” and Dr. Thibault Reveyrand on “New Sampling Paradigm Dedicated to RF Ultra-Wideband Receivers.” The contributed conference papers focus on nonlinear measurement systems, calibration issues, on-wafer measurements, uncertainty, broadband and millimeter-wave measurements, and other areas of RF and microwave measurement.
Also, be sure to check out the joint ARFTG/IMS workshops on “Overview of Advanced Dielectric Measurement Techniques” and “Device model extraction based on Vectorial Large-Signal Measurements” on Monday, as well as the NVNA Users’ Forum on Thursday afternoon. The NVNA Users’ Forum is an informal discussion group devoted to sharing information and issues related to instrumentation utilized in vector large-signal analysis of microwave circuits and systems that contain nonlinear elements. This event is open to all ARFTG, IMS and RFIC attendees.
An important part of any ARFTG Conference is the opportunity to interact one-on-one with colleagues, experts and vendors in the RF and microwave test and measurement community. Whether your interests include high-throughput production or one-of-a-kind metrology measurements, complex systems or simple circuit modeling, small to large signal measurements, phase noise or noise figure or DC to lightwave, you will find similarly interested technologists. Starting with breakfast, continuing through two exhibition/interactive forum sessions and the luncheon, there will be ample opportunity for discussion with others facing similar challenges. Attendees find that these interactions are often the best source of ideas and information for their current projects, so come and join us.
Full details of the technical program and conference are available at: www.arftg.org.
ARFTG Conference registration is available through the IMS website at: www.ims2012.org.
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