MicroApps Expert Forum: Device Characterization Methods & Advanced RF/Microwave Design
Special IMS 2012 MicroApps Presentation
A 90 minute forum and webcast, featuring experts in RF linear and nonlinear device measurement, characterization and circuit design.
Location: IMS 2012 Exhibition MicroApps Theatre,
Stand # 1223
Time: June 20, 12:00 am – 1:30 pm EDT
To meet the demands set by commercial and defense related wireless communication systems, radar and avionics, designers of high-frequency electronics are required to develop products with greater levels of performance and functionality, often with a smaller physical footprint and shorter design cycle. The increasing complexity of advanced RF/microwave devices with interactions between RFICs, packages and PCBs poses a real threat to design success. Our panel of experts will discuss the nature of these challenges and the latest solutions available to designers to reduce design failure. An open panel discussion session will follow the presentations including audience questions from both live and online participants.
Todd Cutler, General Manager, Agilent EEsof EDA
Todd Cutler is the general manager of Agilent EEsof EDA. Agilent EEsof EDA is the industry leader in high-frequency design software. The organization’s revenue places it in the top 5 EDA companies. Todd began his 30-year career working on network analyzers where he helped develop the HP8510. He shifted to EDA in 1986 when he helped found the computer aided engineering group within Hewlett Packard’s Test and Measurement group. In 1998, Cutler later left H-P to be CEO of Eagleware Corporation, the EDA company that pioneered the affordable Genesys RF and microwave design software. In 2005, he joined Agilent Technologies following its acquisition of Eagleware. Todd earned a BEE from Georgia Tech and an MSEE from Stanford University.
Steve Reyes, Product Marketing Network Analyzers, Anritsu
Steve has designed and marketed microwave test equipment for more than 25 years and was a member of the product team for the Model 360 VNA and VectorStar. He has presented numerous papers and conducted workshops on microwave test and measurement for ARFTG, NIST, and IEEE. Steve is the Product Marketing Manager for Vector Network Analyzers at the Microwave Measurement Division of Anritsu Company.
Josh Moore, Solution Architect, AWR Corporation
Josh Moore, a University of Illinois at Urbana-Champaign Engineering Alumni (BSEE 2000), is presently a Solution Architect with AWR. Before joining AWR, Josh spent several years at Nokia as an RF design engineer working on base station and mobile device receivers as well as at Agilent Technologies as an ADS Application Engineer.
Gary Simpson, CTO, Maury Microwave
Gary Simpson received his Bachelor degree from DeVry Institute of Technology in 1972, and his Masters degree from Arizona State University in 1978. He has been involved with microwave measurements since 1973, starting with manual load pull on microwave power transistors at his first job at Motorola. He has been with Maury Microwave since 1982, where he began developing components and fixtures for microwave measurements, including network analyzer calibration standards and techniques. In 1987, he developed the Automated Tuner System (ATS). Since then, he has been responsible for much of the on-going development of device characterization systems. He is currently Chief Technical Officer at Maury, and is involved with strategic product planning and development.
Moderated by Dr. Larry Dunleavy, Modelithics
Lawrence P. Dunleavy co-founded Modelithics, Inc. in 2001 to provide improved modeling solutions and high quality microwave measurement services for RF and microwave designers. Prior to this, Drs. Dunleavy co- developed the University of South Florida’s innovative Center for Wireless and Microwave Information Systems (The WAMI Center). He maintains a part-time position as a Professor within USF’s Department of Electrical Engineering, where has been on the faculty since 1990. Prior to this he worked for Hughes Aircraft and E-Systems companies. Dr. Dunleavy received the B.S.E.E. degree from Michigan Technological University in 1982, and the M.S.E.E. and Ph.D. degrees in 1984 and 1988, respectively, from the University of Michigan. Dr. Dunleavy is a Senior Member of IEEE, and is active in the IEEE MTT Society, and the Automatic RF Techniques Group (ARFTG).
Challenges and Solutions in Device Characterization and Multi-Technology Design
Todd Cutler, Agilent Technologies
High quality models are the foundation of design. Today’s complex designs require not only accurate models but the ability to predict interactions between models and circuits implemented on multiple technologies. Todd Cutler will cover the latest investments Agilent is making to enable accurate device characterization and simulation of multi-technology designs.
New Advancements in Microwave Measurement Technology for Improved Device Characterization
Steve Reyes, Anritsu
The demand for improved efficiencies in microwave and millimeter-wave communication systems stresses the need for improved device characterization and model accuracy. At the core of accurate models are accurate measurements. Anritsu will present a summary of the latest advancements in on-wafer measurements and how better measurement data lead to better models.
Technology Map of Nonlinear Behavioral Models
Josh Moore, AWR
Successful RF/microwave circuit design using active devices requires correct representation of all nonlinear behavior during simulation. A vendor agnostic, nonlinear behavioral model that accurately accounts for various nonlinear effects and correctly interacts with the different RF simulation technologies is of considerable value to the designers of advanced MMICs and RF PCB circuits. A phenomenological summary uncovers modeling technology gaps that designers using simulation software have identified and placed a high importance on for EDA companies to address. The speaker will present recent developments by the company’s R&D organization to address such technology gaps in nonlinear behavioral models, extraction capabilities for these new models, and how it can be facilitated by access to RF test equipment and testing expertise given the recent acquisition of AWR by National Instruments.
Using Harmonic Load-pull to Address Device Characterization for Modern Communication System
Gary Simpson, Maury Microwave
Device characterization has never been more challenging than it is today. Modern communications systems are demanding exceptional levels of efficiency making harmonic load pull and time-domain waveforms commonplace. Modulation schemes are becoming so complex that realistic modulated signals must be used as part of a load pull system, and wideband impedance control is becoming essential. Modern modeling techniques in the form of Compact Transistor and Behavioral models are evolving to support wide band gap technologies such as GaN. And all this must be accomplished with first-pass success in the shortest time to be first to market. Maury will discuss the latest challenges in modern device characterization and newly developed characterization techniques.