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Test and Measurement Channel / Industry News

Anritsu VectorStar used by Modelithics to validate performance of broadband diode models

March 28, 2012
KEYWORDS anritsu / diode / me7838a
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Anritsu Co. announces that its VectorStar Broadband ME7838A vector network analyzer (VNA) system was used by Modelithics Inc. to validate the performance of its flip chip schottky diode model for the W-Band Single Anode and W-Band ZBD schottky diodes from Virginia Diodes (VDI) Inc. Two-port series S-parameter measurements were made using the ME7838A and on-board probing with calibration reference at the component pad-stacks to validate the model’s performance from DC to 125 GHz.

The ME7838A was used to generate ultra-broadband S-parameter data that was used in combination with DC I-V, RF resistance versus current, and harmonic power measurements made from independent instrument setups to develop and validate state-of-the-art nonlinear mm-wave schottky diode models. The ME7838A was selected because of its wide frequency coverage from 70 kHz to 125 GHz, as well as its excellent dynamic range, measurement speed, and calibration and measurement stability.

“We are very excited about the technical advances represented by what we believe to be the broadest band nonlinear diode models developed to date. The overall performance of the Anritsu ME7838A VNA system allowed us to acquire the 125 GHz broadband data very efficiently to enable advancement of models that not only fit this broadband data set well, but that also provided excellent agreement to independently obtain nonlinear harmonic power validations,” said John Fisher, vice president of operations at Modelithics.

“The Anritsu VectorStar ME7838A Broadband System helps design and modeling engineers develop and validate advanced developments such as the models from Modelithics. It provides the frequency coverage and measurement capability necessary for verifying the ever-growing complex designs at microwave and millimeter wave frequencies,” said Donn Mulder, Anritsu senior VP and general manager of the Microwave Measurements Division.

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