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Kaelus introduces range to fault technology
Kaelus announced the availability of Range To Fault (RTF) technology for its 1800, 1900 and 2100 MHz iQA series PIM test instruments. This new technology enables network operators to simultaneously measure the location of PIM and return loss faults in their RF infrastructure using a single test instrument. With RTF technology, network operators will be able to eliminate PIM problems at a cell site faster and reduce the time required to complete site repairs.
“Reflection data combined with PIM data provides an unmatched level of clarity for identifying the location of faults in the RF path,” said Michael Symes, President of Kaelus Site Solutions. “In 1996 Kaelus pioneered the development of factory PIM test equipment and in 2005 was first to introduce portable PIM test solutions. Kaelus has been an innovator in the PIM test equipment market for more that 15 years and is proud to continue that tradition today with the introduction of Range to Fault technology.”
The Kaelus Range to Fault solution features an external RF module fitted to the test port of an “RTF Enabled” iQA PIM test instrument. Existing A or B-series iQA PIM test instruments can be factory upgraded to provide RTF functionality. “We understand that PIM test equipment is a significant investment,” said Tom Bell, Vice President of Marketing and Business Development for Kaelus Site Solutions. “By implementing RTF as an add-on solution we have protected our customer’s investment and provide a cost effective path to acquire this new capability.”
In the field, operators can quickly switch between PIM test mode, spectrum monitoring mode and Range to Fault mode using the iQA touch screen interface without having to disconnect from the system under test. In addition, RTF enabled instruments perform a low power return loss measurement to verify the system match before activating the high power PIM test transmissions. This feature improves not only the safety for test operators but also protects the test instrument from excessive reflected power.