- Buyers Guide
Military Microwaves Supplement
Recent Advances in Radar Technology
Using Calibration to Optimize Performance in Crucial Measurements
Agilent Technologies Inc. announced it will demonstrate its high-speed digital test solutions at DesignCon 2012, January 31-February 1, at the Santa Clara Convention Center, Santa Clara, Calif., in booth 201.
Agilent's high-speed digital solutions offer a wide range of essential tools to help engineers design and simulate, analyze, debug and achieve compliant designs while cutting through the challenges of gigabit digital designs.
Agilent will also be doing live demos of transmitter, receiver and protocol testing with new tools for PCIe(r) 3.0. The new N4880A reference clock multiplier enables accurate receiver testing of PCIe mainboards without complex setups. In addition, the company will demonstrate the latest versions of its N5990A test automation software, which increases R&D efficiency with support for PCIe 3.0 Base and CEM specification testing.
Agilent will also participate in an educational forum called Design and Test Challenges in Next Generation High-Speed Serial Standards, January 30 from 1:30 to 4:30 p.m. and February 1 from 8:30 to 11:30 a.m., in the second-floor theater of the Santa Clara Convention Center. The standards include PCIe 3, DDR 3/4, USB 3 and FPGA 28-Gb/s serial.
Get access to premium content and e-newsletters by registering on the web site. You can also subscribe to Microwave Journal magazine.