Cleveland, Ohio – January 30, 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the release of its 2008 Test and Measurement Product Guide. This handy product guide offers details and specifications on Keithley's general-purpose and sensitive sourcing and measurement products, DC switching, RF switching and measurement, data acquisition solutions, semiconductor test systems, and optoelectronics test hardware. Tutorials simplify choosing solutions for specific applications. To request a free copy of Keithley's 2008 Test and Measurement Product Guide, visit Arranged by product type and application area, each section of Keithley’s 2008 Test and Measurement Product Guide contains technical information on test-system design and use with practical tips to help users avoid common measurement errors, increase productivity, and lower their cost of test. The guide includes useful tutorials and selector guides, as well as information on the newest innovations in test and measurement, including: · Digital Multimeters and Systems · Switching and Control · RF/Microwave Sourcing, Switching and Measurement · Specialized Power Supplies · Source and Measure Products · Low Level Measurement and Sourcing, including Low Current, High Resistance Measurements and Low Voltage, Low Resistance Measurements · Pulse/Pattern Generators · Semiconductor Test · Optoelectronics Test · Series KPXI System Products · Data Acquisition Products New products featured in the 2008 Test and Measurement Product Guide include: · Keithley’s 4X4 MIMO (multiple-input, multiple-output) RF test system for R&D and production testing of next generation RF communications equipment and devices, consisting of the new Model 2920 Vector Signal Generator and Model 2820 Vector Signal Analyzer, Model 2895 MIMO Synchronization Unit, and powerful MIMO Signal Analysis Software · The Models 2635 and 2636, additions to Keithley’s successful Series 2600 System SourceMeter® Multi-Channel I-V Test Solutions, with low level measurement capabilities · The Series 3700 System Switch/Multimeter and Plug-in Card Family, the next-generation platform of switching and integrated digital multimeter (DMM) test solutions · The Model 2100 6½-Digit USB Digital Multimeter (DMM), a high precision, low-cost USB-based instrument · ACS (Automated Characterization Suite) integrated test systems for semiconductor characterization at the device, wafer, and cassette level · Hardware and software advances for Keithley’s award-winning Model 4200-SCS Semiconductor Characterization System, including an enhanced pulse generator card and a new scope card, as well as a new C-V measurement capability