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Software & CAD

Series 3700 System Switch/Multimeter and Plug-in Card Family

January 17, 2011
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Cleveland, Ohio – September 13, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the release of the Series 3700 System Switch/Multimeter and Plug-in Card Family, Keithley’s next-generation platform of switching and integrated digital multimeter (DMM) test solutions. It offers high quality, instrument grade switching for a wide variety of applications, including the performance demands of high channel count applications, with its ability to control up to 576 multiplexer channels in an industry-leading six-slot, 2U form factor. A high-performance integrated DMM option provides fast, low-noise measurements with resolutions up to 7½-digits at a price lower than typical 6½-digit DMMs. To learn more about the Series 3700 and to view a short product demo, visit The Series 3700 System Switch/Multimeter solutions offer scalable, high-performance switching and multi-channel measurements that are optimized for automated testing of electronic products and components. Together with a growing family of plug-in switch and control cards, the Series 3700 is ideal for either a functional test system or in stand-alone data acquisition and measurement applications for production and functional testing of electronic products and devices, especially multi-channel I-V testing and accelerated stress tests. The Series 3700 is available with four different mainframe options for added flexibility. For instance, users can choose a mainframe without the integrated DMM as well as one without a front-panel display and keypad. The optional integrated DMM eliminates the need to manually coordinate an external DMM with a switch topology, freeing up valuable development time. Also, a USB 2.0 port on the front panel provides “transportable memory” that allows users to save measurements to non-volatile memory. The base Model 3706 features an integrated 7½-digit, high-performance DMM. In addition to supporting 13 built-in measurement functions, measurement ranges are expanded to include a 1-Ohm low-resistance range and a 10-μAmp low-current range. The Model 3706 mainframe contains a multi-processor architecture to maximize measurement speed and system throughput. It features a single-channel reading rate that ranges from greater than 10,000 DCV/two-wire Ohms readings per second at 3½-digit resolution to 60 readings per second at 7½-digit, 26-bit resolution if needed. The Series 3700 also incorporates Keithley’s Test Script Processor (TSP™) technology. TSP redefines the traditional boundaries of test instrumentation by bringing PC-like functionality into the instrument. For example, users can create test scripts that are embedded in and executed within the instrument. These test scripts can contain complete test routines, including complex decision making and instrument control, enabling the instrument to perform autonomously. In addition, Keithley provides a free software tool, Test Script Builder, for conveniently writing, managing, and debugging test scripts. This distributed processing technology reduces PC intervention, eliminating bus latency issues and improving test throughput and flexibility. For applications where throughput and timing synchronization is not required, TSP also gives users added flexibility by executing single line commands just like traditional instruments. One important supporting technology for TSP is TSP-Link™, a communication bus that allows multiple TSP instruments to be configured in a master/slave network. TSP-Link offers the capability to expand a test system, allowing TSP-enabled instruments such as the Series 3700 and Series 2600 SourceMeter® Instruments to be scaled according to present or future testing needs. Such TSP-enabled instruments give test engineers the fundamental building blocks for designing tightly integrated, high throughput ATE systems...

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