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IC-CAP (Integrated Circuit Characterization and Analysis Program) is a device modeling program that provides powerful characterization and analysis capabilities for a broad range of semiconductor modeling processes.
IC-CAP offers device engineers and circuit designers advanced modeling software for device modeling including instrument control, data acquisition, graphical analysis, simulation, optimization, and statistical analysis.
Using the IC-CAP Platform with IC-CAP Extraction Packages combines the power and flexibility of the platform with an automated procedure to measure and extract a particular model.
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