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Test and Measurement

Agilent Delivers THz Vector Network Analysis Measurement Solution to Japan’s Yamaguchi University

April 14, 2011
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SANTA CLARA, Calif., – Apr. 14, 2011 – Agilent Technologies Inc. (NYSE:A) today announced delivery of the world’s first fully integrated 1.1-THz network analysis measurement solution to Japan’s Yamaguchi University. The solution will play a critical role in enabling the university to study metamaterials at THz frequencies.

The THz region of the electromagnetic spectrum has enormous potential for high-data-rate communications, advanced electronic materials spectroscopy, space research, medicine, biology, surveillance and remote sensing. Despite its potential, the THz region remains one of the most unexplored areas of the spectrum. And, since high-power THz sources rely heavily on materials with advantageous properties in the THz frequency range, materials research is a critical component of modern THz systems.

Agilent’s integrated measurement solution addresses this challenge by enabling accurate measurement of THz signals in new materials. Such information is critical to the successful resolution of Yamaguchi University’s materials research.

Agilent’s solution features the world’s first fully calibrated, 750-GHz to 1.1-THz frequency extension module, the WR-01, from Virginia Diodes Inc., coupled with Agilent’s high-performance 50-GHz PNA-X vector network analyzer. Together, these tools allow for a fully calibrated, vector network analysis measurement with greater than 50 dB of dynamic range.

For the first time, users can take advantage of the PNA-X’s calibration technology to make stable and repeatable THz measurements. The instrument’s dynamic range also ensures that users can easily achieve highly sensitive measurements. And, with the frequency extension module’s ability to operate across the 750-GHz to 1.-THz frequency range, users can now easily capture higher resolution images as well.

“At Virginia Diodes, our mission is to make the THz region of the electromagnetic spectrum as useful for scientific, military and commercial applications as the microwave and infrared bands are today,” said Thomas Crowe, chief executive officer of Virginia Diodes. “Our development of the WR-01 extender delivers on this promise, offering the excellent dynamic range and bandwidth required for THz-calibrated vector network analyzer measurements.”

“Working closely with Virginia Diodes, we were able to integrate the WR-01 extender into our PNA-X vector network analyzer, further extending its capabilities and enabling fast and accurate measurements at THz,” said Gregg Peters, vice president and general manager of Agilent’s Component Test Division. “This development further demonstrates our commitment to continual measurement innovation and ensuring our customers have the tools they need to stay ahead of the curve.”

Agilent’s PNA-X vector network analyzer provides the industry’s widest range of measurement applications, from RF to millimeter wave. More information about the PNA-X is available at www.agilent.com/find/pna-x. Photos of the integrated THz measurement solution are available at www.agilent.com/find/THz_PNAX_images.

Yamaguchi University is located in Ube-city, Japan. Its characterization of materials at THz frequencies is part of an ongoing effort within the school of science and engineering. For more information, go to www-ap.apsci.yamaguchi-u.ac.jp.

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