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Optical / Semiconductors / Integrated Circuits / Subsystems and Systems / Test and Measurement

Agilent Technologies’ Atomic Force Microscope Chosen by Imperial College of London

July 23, 2010
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Facilitates Research into Organic and Hybrid Semiconductor Systems and Opto Electronic Devices

CHANDLER, Ariz., July 23, 2010 -- Agilent Technologies Inc. (NYSE: A) today announced the installation of an Agilent 5500 atomic force microscope (AFM) in the Blackett Laboratory, Department of Physics, Imperial College London.

Dr. Thomas Anthopoulos, a reader in Experimental Solid-State Physics, will be the primary user of the new AFM. His main research interests are within the fields of charge-carrier transport in organic, oxide and organic-inorganic hybrid semiconductor systems. Dr. Anthopoulos’ research interests also include the development of electronic and optoelectronic devices such as low-cost, large-area integrated microelectronics, discrete optical sensors and optical sensor arrays.

The Agilent 5500 AFM has been optimized to perform precision electrical measurements, in particular, high-spatial-resolution Kelvin force microscopy (KFM) and current sensing. The 5500 also allows high-resolution topographic and phase imaging, as well as offering exceptional environmental control for testing samples under various environmental conditions.

“We are thrilled that Dr. Anthopoulos has chosen to utilize Agilent AFM instrumentation,” noted Jeff Jones, operations manager for Agilent’s nanoinstrumentation facility in Chandler, Ariz. “Dr. Anthopoulos’ research is paving the way for the development of novel organic, inorganic, and hybrid semiconductor systems and cost-effective, high-performance electronic and optoelectronic devices. We look forward to providing him with the state-of-the-art tools and technologies needed to further his work. In particular, we are very excited about the opportunity to support his use of advanced KFM techniques perfected by Dr. Sergei Magonov on the Agilent 5500.”

Among Dr. Anthopoulos’ ongoing projects are the development of ambipolar organic field-effect transistors; air-stable complementary and complementary-like integrated circuits; light-sensing transistors and integrated optoelectronic circuits; and organic nanoscale channel transistors and integrated circuits. Additional ongoing projects include graphene-based electronic and optoelectronic devices; self-assembling molecular nanodielectrics; and the study of charge-carrier dynamics in organic semiconductors and devices.

“We are very excited about the possibilities that the Agilent 5500 AFM system will enable, especially in our research for novel high-performance semiconducting materials and devices,” said Dr. Anthopoulos. “The high-spatial-resolution Kelvin force microscopy and current sensing capabilities of the system combined with its excellent environmental control will allow study of the electronic and structural properties of these novel material systems and devices down to nanometer scale.”

AFM Instrumentation from Agilent Technologies
Agilent Technologies offers high-precision, modular AFM solutions for research, industry, and education. Exceptional worldwide support is provided by experienced application scientists and technical service personnel. Agilent’s leading-edge R&D laboratories ensure the timely introduction and optimization of innovative and easy-to-use AFM technologies.

For more information visit the company’s website by clicking the link below our logo on this page.

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