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Software & CAD / Test and Measurement

Rohde & Schwarz 2010 North American LTE Forum

March 23, 2010
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March 23, 2010

CTIA Wireless 2010, Las Vegas - Rohde & Schwarz today announced that it will sponsor the 2010 North American LTE Forum, to be held in the Dallas-Fort Forth, TX area on May 4 and 5. The event will bring together experts from all areas of the wireless industry who will share their views, offer guidance, and discuss future enhancements to the 3GPP LTE standards. Speakers at the two-day event include representatives from Verizon Wireless, Nokia Siemens Networks, University of Colorado, ASTRI, Skycross, IXIA, and many others.

The event, which is the first of its kind to be held in North America, will cover LTE Release 9, LTE-Advanced (the next level of UMTS LTE covered by 3GPP Release 10), and future enhancements as well. Attendance is free of charge, meals and beverage will be provided, and the deadline for registration is April 15. The forum will be extremely valuable for anyone who has worked with third-generation networks and will be deploying LTE, from lab managers, transceiver designers, software and protocol developers, network and systems and test engineers, to application and support engineers, product managers, and marketing and sales engineers.

Discussions will include how LTE differs from third-generation wireless, how to bridge the gap between LTE and HRPD/1xEV-DO, how to perform RF measurements on a LTE-capable device in connected mode, how to generate phase-coherent signals with MIMO and testing beamforming, and how to measure LTE MIMO network performance. Additional topics include the impact of digital IQ on LTE testing, simultaneous evaluation of LTE and CDMA2000® 1xRTT/1xEV-DO at the network level, the potential market for TD-LTE in the Americas and its advantages over LTE FDD, co-existence of LTE and digital TV, and the ramifications of LTE's high peak-to-average power ratio (crest factor).

Attendees will receive documentation about Release 9 and 10 LTE markets and standardization, future technical enhancements and requirements beyond LTE Release 8, insight into test and measurement challenges for LTE and LTE-Advanced, and presentations about smart test solutions for LTE technology.

Registration and Information
The 2010 North American LTE Forum will be held Tuesday and Wednesday, May 4 and 5, in Dallas TX. To register, visit www.rs-us.net/lte010.

Information is available by calling the Rohde & Schwarz Technical Customer Support Center at (888-837-8772) from 8 am to 7 pm EST, or by sending an e-mail to lteforum@rsa.rohde-schwarz.com.

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