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Agilent Technologies Wins EDN and Test & Measurement World Awards

April 13, 2009
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SANTA CLARA, Calif., April 13, 2009 -- Agilent Technologies Inc. (NYSE: A) today announced it won product category awards by both EDN and Test & Measurement World. The winners, chosen by the readership, were announced at awards ceremonies held by each publication.

Agilent won:

EDN "Innovation of the Year" Award Winners 2008

ο Oscilloscopes - Infiniium 90000A Series Real-Time High-Performance Oscilloscope
ο Design for Test, Production Test and Metrology - Cover-Extend Technology
ο EDA: PCB, FPGA and Mixed-signal/RF ICs - RF Design Solution from Mentor Graphics and Agilent's Advanced Design System EDA software

Test & Measurement World "Best in Test" Winners 2009

ο Board and system test and configuration - Cover-Extend Technology
ο RF/microwave instruments: Application/standard specific - DigRF v4 RDX (Radio Digital Cross Domain) Solution,
ο Test accessories and interconnects - DDR2 and DDR3 BGA probe (W2630A series)
ο Test-development and test-management software - Agilent VEE Pro 9.0

Over the past several months, Agilent has won 14 industry awards, was a finalist in 20 product categories, and six different products won multiple awards. Click here for a full list.

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