Only Test Instrument to Earn E-Tech Award Announced at CTIA WIRELESS.

April 5, 2009 - Anritsu Company announces its MD8430A Signalling Tester was the only test instrument to win a prestigious CTIA Emerging Technology (E-Tech) Award, announced during the International CTIA WIRELESSS 2009 show in Las Vegas. The MD8430A, the industry's first LTE base station simulator, earned a second prize in the 4G-Service Creation & Development category of the E-Tech Awards, which recognize the finest wireless products and services.

"We are thrilled and honored to have won a CTIA E-Tech award because it signifies the best and brightest technologies in the wireless market. We would like to thank everyone who participated in the voting and supported the MD8430A," said Wade Hulon, Vice President and General Manager of Anritsu Company, Americas Sales Region. "The MD8430A is being used by LTE chipset manufacturers to ensure the quality of their products, speed time to market, and reduce design and production test costs."

Approximately 300 entries were received for this year's E-Tech Awards. They were reviewed by a panel of 30 recognized members of the media, industry analysts and executives who selected finalists based on innovation, functionality, technological importance, implementation and overall "wow" factor. More than 40,000 wireless professionals voted on the finalists to determine the winners in 18 categories.

The MD8430A is a highly accurate cost-effective solution for manufacturers of LTE chipsets and mobile devices to evaluate their products and improve time to market. Developed in conjunction with leading chipset manufacturers, the MD8430A augments Anritsu's broad 3GPP test suite, providing developers of wireless devices and systems with a single-source test solution company.

The MD8430A is designed with 4 RF units that enable 2x2 MIMO system handover tests in a simulated network environment. The base station simulator can conduct end-to-end testing at downlink speeds up to 150 Mbps and uplink speeds up to 50 Mbps. All critical 3GPP air-interface LTE protocol tests, including baseband coding/decoding processing tests; protocol sequence tests, such as position registration, origination, termination, handover, terminal and network disconnect tests; and application tests, are supported. Powerful L1/L2 cache analysis functions are provided as well.