Demonstration Marks First Public Showing of LTE User Equipment RF Measurements on a One-Box Tester.

BARCELONA, Spain, 2009 Mobile World Congress, Hall 1, Stand D45, Feb. 16, 2009 -- Agilent Technologies Inc. (NYSE: A) today announced it will demonstrate LTE EVM, Tx power measurements and downlink transmit diversity for mobile device test using the E6620 wireless communications test set here at Mobile World Congress. Agilent will offer these capabilities for bench-top device test via LTE mobile test software for the E6620, as well as in its design verification test system based on the E6620. This demonstration marks the first-ever public showing of LTE UE RF measurements on a one-box tester.

“The E6620 wireless communications test set platform is the cornerstone of Agilent’s product portfolio for testing LTE mobile devices across the entire R&D lifecycle,” said Niels Faché, vice president and general manager of Agilent’s Mobile Broadband Division. “Partnering with Anite, we have already developed several first-to-market LTE test products to ensure the success of LTE deployment to meet aggressive time-to-market goals. Providing UE RF measurements to further meet the needs for LTE device design empowers our customers to stay at the forefront of this fast-evolving technology.”

The RF measurements are part of a comprehensive suite of Tx and Rx measurements that will be offered via the Agilent N6050A LTE Mobile Test Software (LMTS) -- the E6620 software product for use by protocol and RF developers characterizing LTE RF devices on their bench top. Using the same measurement algorithms as in Agilent’s mid-range MXA signal analyzer, developers save cycle time when measurements are consistent from RF development through UE verification. Key LMTS features include integrated fading and MIMO/diversity test, end-to-end IP data connectivity test, and real-time protocol stack. LMTS receiver measurements for characterizing the performance of LTE UE designs with the E6620A MIMO and internal channel-fading capabilities provide users with a powerful set of tools for UE design verification and testing.

The E6620 portfolio will also offer engineers design verification with the GS-8860 Design Verification Test (DVT) system using these same RF measurements. The DVT system can be used in all stages of LTE development, providing a test tool for prototype UE evaluation, as well as commercial UE design verification and pre-conformance testing. Key DVT system features include support for RF transmitter (S6), receiver (S7) and performance (S8) test, integrated baseband fader and MIMO/diversity, and system scalability to RF conformance test.

The Agilent E6620 platform is designed to host a comprehensive set of LTE mobile development and test solutions spanning the entire R&D lifecycle, from early development through conformance and acceptance test. UE RF characterization with LMTS software and the DVT system further demonstrate Agilent’s commitment to provide early products for LTE device test, a commitment that began with the LTE protocol test solution, developed in partnership with Anite. The resulting product, the Anite SAT LTE Protocol Development Toolset, is now commercially shipping on the E6620A platform with a protocol stack that was jointly developed with Anite.

With its common LTE protocol stack for testing across the lifecycle, the E6620’s integrated set of design and test solutions allows engineers to achieve consistent test results across the LTE design lifecycle, faster and simpler debug and fix cycles, easier problem replication between development groups, faster certification and acceptance testing, and faster overall development and time-to-market.

“Agilent is fully committed to delivering LTE-compliant solutions across the entire development lifecycle,” said Ron Nersesian, vice president of Agilent’s Wireless Business Unit. “Today’s announcements further demonstrate this commitment and empowers engineers to stay at the forefront of this fast-evolving technology.”

For more information about the E6620 portfolio of test solutions, go to