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Amplifiers / Antennas / Passive Components / Semiconductors / Integrated Circuits / Software & CAD / Subsystems and Systems / Test and Measurement / Transmission-Line Components

Agilent Presents a Webcast Series on Comparing and Using LXI and PXI in Test Systems

July 20, 2007
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What: This three-part series will explore a comparison of LXI and PXI measurement platforms, journey into maximizing the usefulness of each platform and then look at optimizing system performance using smart instruments in LXI. Who: Design validation engineers and managers in the automotive, medical, industrial, communication and aerospace & defense industries. You may have product test responsibility and are evaluating future test needs or want to learn about new test technologies and trade-offs between test architectures When: The first one-hour session will be held on July 24, 2007 and the series will finish on September 26, 2007. Content will also be available for on-demand viewing for those who cannot attend the live event. * Comparing LXI and PXI as measurement platforms July 24, 2007, 10AM-11AM PDT * Getting the most out of LXI and PXI. August 15, 2007, 10AM-11AM PDT * Optimizing system performance, Using the capabilities of new, smart instruments September 26, 2007, 10AM-11AM PDT Where: Sign up for the series at LXI/PXI webcast series

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