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Amplifiers / Antennas / Semiconductors / Integrated Circuits / Software & CAD / Subsystems and Systems / Test and Measurement / Transmission-Line Components

Agilent Media Alert: Free Webcast on Medalist Bead Probe Technology

December 15, 2006
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What: The Agilent Medalist Bead Probe Technology webcast will present a technology overview and discuss the benefits realized by testing PCBs populated with bead probes during in-circuit test. Topics will include layout independence of this technology, which removes the need for time-consuming PCB lay-out changes; improved test access and coverage; how to maintain excellent probe contact and minimizing trace re-routing. Agilent Medalist Bead Probe Technology is an exciting new methodology for placing test points directly onto the copper traces of a printed circuit board (PCB). When: January 24, 2007, 11:00 a.m.-12:00 noon. Pacific Standard Time Where: Registration and additional information at www.agilent.com/find/beadprobe Media/ Analysts:For any additional questions about Agilent's Agilent Medalist Bead Probe Technology contact Sandy Lang at +1 970 635- 6140 or janet_smith@agilent.com to set up a specific meeting time.

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