Anritsu Company introduces the MT8222A BTS Master, a lightweight, handheld base station analyzer that provides wireless field technicians with a single test solution for installing, deploying, and maintaining today's complex wireless networks. Weighing only 8 pounds, the MT8222A BTS Master packs a complete set of tools that includes cable and antenna analysis, spectrum analysis, power meter, WCDMA/HSDPA and GSM/GPRS/EDGE RF and demodulation, WCDMA/HSDPA Over the Air (OTA), interference analysis, Bit Error Rate Tester (BERT), channel scanner, and power monitor, eliminating the need for technicians to carry several instruments in the field.

The hallmark of the MS2717A is its phase noise performance, which is typically -110 dBc/Hz SSB phase noise at 10 kHz offsets up to 6 GHz. This type of performance allows the MS2717A to easily measure most wireless local oscillators and synthesizers. Superior typical dynamic range of 100 dB means fast and precise test of wireless components requiring exceptional linearity. Its wide 8 MHz capture bandwidth supports the optional WCDMA/HSDPA RF measurements and WCDMA demodulation for simplifying test of Node-B transmitters.

Ergonomically designed, the MS2717A has controls that are easy to learn and use to improve productivity for manufacturing, R&D, and general purpose test. The combination of performance and ease of use makes the MS2717A well suited for verifying RF components in 3G, TD-SCDMA, WiMAX, WiBro, and other wireless technologies that are now common in manufacturing environments.

The MS2717A can also be configured to provide truly affordable test of Node-B transmitters. With options, the signal analyzer mode frequency ranges are 824-894 MHz, 1710-2170 MHz and 2300-2700 MHz. For basic RF measurements, a WCDMA/HSDPA RF measurements option offers smart measurements of ACLR, multi-channel ACLR, and spectral emission mask, as well as RF summary tables for quick node B analysis. A WCDMA demodulator option provides Code Domain Power, Codogram, EVM, and modulation summary for detailed node-B analysis. A Pass/Fail mode based upon the five 3GPP test models (reference TS125.141 specifications) is also available to further simplify testing.