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Test and Measurement Channel

Reduce EMC Product Verification Time with Fast Scanning Techniques

July 13, 2011
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Bringing products to market quickly is critical in today’s competitive business environment. Faster cycle times result in lower product development costs, enable earlier revenue capture, and provide a higher level of adaptability to changes in market demands.

Leveraging fast scanning techniques in EMC compliance testing can reduce product verification time by expediting the process of configuring the device under test for maximum emissions and enhancing the collection of suspect signals to the signal list. Further reduce verification time using fast pre-scanning by rapidly identifying the list of suspect frequencies on which to perform the more time-consuming final measurements.

Recent Articles by White Paper, Agilent Technologies

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