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Industry News / Test and Measurement

AMCAD to Demonstrate STAN Tool for Microwave Circuit Stability Analysis

October 10, 2011
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AMCAD Engineering is showing its newest automated stability analysis tool for RF and microwave circuit designers at European Microwave Week (Stand 523), October 11 to 13, Manchester Central, Manchester, England.

STAN tool offers a revolutionary stability analysis technique of microwave circuits, valid for small-signal and large-signal regimes. This technique is able to detect and determine the nature of oscillations, such as parametric oscillations in power amplifier that can be for example function of the input drive signal. Knowledge of the type of oscillation mode facilitates the insertion of stabilization networks, with a better balance between the required oscillation avoidance and maintaining the original circuit performances.

Compatible with commercial CAD tools for microwave circuit design, STAN tool user-friendly and efficient interface give users a great ability to analyse linear and non-linear stability of their design in an intuitive manner.

STAN tool is integrated in IVCAD advanced measurement and modelling software platform.

Additional Demonstration

Maury/ AMCAD’s IVCAD software platform offers a complete, turn-key modeling flow and the quickest path to advanced design. In a unified measurement and modeling environment, accurate and efficient model parameter extraction can be performed from pulsed IV and pulsed RF measurements, and validated through dedicated Load-Pull measurements.

The demonstration will include industry-proven pulsed IV/RF characterization system on Maury’s booth #401, and FET modelling plug-in, a dedicated tool to extract accurate linear and non-linear compact measurement based models of field effect transistors (FET). This plug-in address all FET devices (MESFETs, HEMTs, LDMOS) on gallium arsenide (GaAs), gallium nitride (GaN), as well as many other technologies such as indium phosphide (InP) or silicium (Si).

X-Parameter™ Modeling Services

AMCAD offers non-linear X-parameter measurement and modeling services, as well as dedicated behavioural models of both packaged and unmatched transistors and 50 Ohms circuits. Visit us in stand #523 to meet our experts.


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