Focus Microwaves Corp., a device characterization solutions provider, announced several multi-national Tier 1 foundries and RFIC ODMs have placed orders for advanced noise characterization systems based on Focus NPEx 2.0, the world’s most advanced noise characterization toolset, and Agilent Technologies’ PNA-X network analyzer.

Building on breakthrough technology in parametric stability and extraction speed, the world’s most demanding foundries and ODMs have migrated to Focus noise characterization solutions, from competitive solutions, to meet the exacting noise modeling needs of advanced processes, including deep-submicron 35 nm CMOS and ultra-low noise mm-wave GaAs HBT.

Commenting on the orders, Focus Microwaves CEO Christos Tsironis, noted, "The world’s most demanding CMOS and GaAs foundries and ODMs require ultra-stable and ultra-fast noise modeling tools for characterization of the processes that power the latest generation of 4G wireless devices and mm-wave personal connectivity solutions. Focus listened and responded by developing breakthrough noise modeling technology in parametric repeatability and stability, leading to dramatic improvements in accuracy and speed."

Key features of NPEx 2.0 include:

• The industry’s most stable, repeatable and accurate noise parameter extraction toolset

• Coupled with Agilent PNA-X, offers the industry’s fastest noise measurement platform

• The industry’s only single-tuner platform spanning 800 MHz to 77 GHz

• Single-touch single-sweep reduces measurement time and increases accuracy

• Multi-dimensional swept-bias and swept-frequency extraction domain

• Enhanced integration with industry-leading wafer-probe systems

• Full compatibility with industry-leading modeling tools, including Agilent IC-CAP

For on-site demonstrations of this innovative new technology, or for personal demo licenses, contact your regional Focus Microwaves representative.