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Industry News

AFM-VNA Technique Enables Compound, Calibrated Electrical and Spatial Measurements at Nanoscale

December 4, 2010
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Measuring electromagnetic properties of materials can provide insight into applications in many areas of science and technology. Increasingly, these properties need to be evaluated at the nanometer scale. Since electromagnetic properties, such as the dielectric constant, are ultimately related to a material’s molecular structure, correlating the detailed physical structure...
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